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To: Peter
To: Den
To: Haan <denhaan@ra*.or*>
Subject: Re: DIN connection
From: cherf@ci*.co* (Scott Cherf)
Cc: techdiver@opal.com
Date: Fri, 14 Apr 1995 09:04:02 -0700

At 8:00 AM 4/14/95, Peter Den Haan wrote:
>I have heard on several occasions mention re the reliability of DIN
>connections. Could someone elaborate please?

I think the main argument is that the o ring is 'trapped' by the DIN
connection and can't be blown out suddenly at depth.  You either get
a good connection from the start or you don't; no sudden surpises
later.

Scott.

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